Astronomical data analysis II : 27-28 August 2002, Waikoloa, Hawaii, USA. pp.371-378, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Cui, C. ; Fritsching, U. ; Schulz, A. ; Bauckhage, K. ; Mayr, P.
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PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.2795-2798, 2005. Uetikon-Zuerich. Trans Tech Publications
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.559-566, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China. pp.567-572, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Quinn, P. J. ; Barnes, D. ; Csabai, I. ; Cui, C. ; Genova, F. ; Hanisch, B. ; Kembhavi, A. ; Kim, S. C. ; Lawrence, A. ; Malkov, O. ; Ohishi, M. ; Pasian, F. ; Schade, D. ; Voges, W.
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Optimizing scientific return for astronomy through information technologies : 24-25 June 2004, Glasgow, Scotland, United Kingdom. pp.137-145, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Cui, C. ; Zhao, Y.-H. ; Wang, X. ; Sang, J. ; Luo, Z.
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Optimizing scientific return for astronomy through information technologies : 24-25 June 2004, Glasgow, Scotland, United Kingdom. pp.233-241, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ecosystems Dynamics, Ecosystem-Society Interactions, and Remote Sensing Applications for Semi-Arid and Arid Land. Part One pp.320-327, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering