1.

国際会議録
国際会議録
1. FEASIBILITY OF SIMOX MATERIAL QUALITY DETERMINATION USING SPECTROELLIPSOMETRY: COMPARISON WITH RAMAN AND PLANAR VIEW TRANSMISSION ELECTRON MICROSCOPY
Crean, G. M. ; Lynch, S. ; Greef, R. ; Stoemenos, J. ; Rossow, U. ; Richter, W.
出版情報: Phase formation and modification by beam-solid interactions : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.139-144,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 235
2.

国際会議録
国際会議録
2. Selective Electroless Copper Metallization of Epoxy Substrates
Campion, L. M. ; O'Reilly, M. ; Macauley, D. J. ; Kelly, P. V. ; Crean, G. M.
出版情報: Materials for mechanical and optical microsystems : symposium held December 4-5, 1996, Boston, Massachusetts,U.S.A..  pp.69-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 444
3.

国際会議録
国際会議録
3. Photo-Induced CVD of Tantalum Pentoxide Dielectric Films Using an Injection Liquid Source
Zhang, J-Y. ; Boyd, I. W. ; Mooney, M. B. ; Hurley, P. K. ; O'Sullivan, B. J. ; Beechinor, J. T. ; Kelly, P. V. ; Crean, G. M. ; Senateur, J-P.
出版情報: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.397-,  1999.  Warrendale, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 567
4.

国際会議録
国際会議録
4. REFLECTANCE ANISOTROPY AND SPECTROSCOPIC ELLIPSOMETRY CHARACTERISATION OF WET SILICON WAFER CLEANING
Beechinor, J. T. ; Kelly, P. V. ; Crean, G. M.
出版情報: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.59-,  1994.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 324
5.

国際会議録
国際会議録
5. PHOTOREFLECTANCE CHARACTERISATION OF REACTIVE ION ETCHED SILICON
Murtagh, M. ; Beechinor, J. T. ; Herbert, P. A. F. ; Kelly, P. V. ; Crean, G. M. ; Jeynes, C.
出版情報: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.167-,  1994.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 324
6.

国際会議録
国際会議録
6. Atomic-Force-Microscopy Investigation of the Morphology of a uv Photodefined Palladium Activation Layer on Alumina Ceramic and the Nucleation of Electroless Copper at the Activated Sites
Lafferty, E. J. ; Macauley, D. J. ; Kelly, P. V. ; Crean, G. M.
出版情報: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.329-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 441
7.

国際会議録
国際会議録
7. Ultraviolet Excimer Lamp Photoassisted Selective Palladium Activation of Coarse-Grain 96% Alumina Ceramic for Selective Electroless Copper Plating
Macauley, D. J. ; Kelly, P. V. ; Crean, G. M.
出版情報: Electronic packaging materials science IX : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.45-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 445
8.

国際会議録
国際会議録
8. Optical and Electrical Characterization Study of SiCl4 Reactive-Io-Etched GaAs
Murtagh, M. ; Ye, Shu-Ren ; Masterson, H. J. ; Beechinor, J. T. ; Crean, G. M. ; Auret, F. D. ; Deenapanray, P. N. K. ; Mayer, W. E. ; Goodman, S. A. ; Myburg, G.
出版情報: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.75-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 442
9.

国際会議録
国際会議録
9. Electrical Characterization of Defects Introduced During Plasma-Based Processing of GaAs
Auret, F. D. ; Myburg, G. ; Meyer, W. E. ; Deenapanray, P. N. K. ; Nordhoff, H. ; Murtagh, M. ; Ye, Shu-Ren ; Masterson, H. J. ; Beechinor, J. T. ; Crean, G. M.
出版情報: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.51-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 442
10.

国際会議録
国際会議録
10. Anisotropic Dielectric Function Properties of Semi-Insulating 4H-SiC Determined from Spectroscopic Ellipsometry
Kildemo, M. ; Mooney, M. B. ; Kelly, P. V. ; Sudre, C. ; Crean, G. M.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.571-574,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)