1.

国際会議録
国際会議録
1. Photovia Technology:Some Important Aspects for Reliability
Zhang,Suixin ; Baets,J.De ; Calster,A.Van ; Corlatan,D. ; Langhe,P.De ; Allaert,K.
出版情報: Proceedings : 1999 International Symposium on Microelectronics : 26-28 October 1999, Chicago, Illinois.  pp.240-245,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3906
2.

国際会議録
国際会議録
2. Photohuninescence of donor acceptor pair transitions in hexagonal and cubic MBE-grown GaN
Kruger,J. ; Corlatan,D. ; Kisielowski,C. ; Kim,Y. ; Klockenbrink,R. ; Sudhir,G.S. ; Rubin,M. ; Weber,E.R.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1191-1196,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263