1.

国際会議録
国際会議録
1. Evaluation and improvement in sensor performance and durability for structural health monitoring systems [6179-20]
Blackshire, J. L. ; Cooney, A.
出版情報: Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA.  pp.61790K-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6179
2.

国際会議録
国際会議録
2. Advanced imaging of hidden damage under aircraft coatings [6179-02]
Cooney, A. ; Blackshire, J. L.
出版情報: Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA.  pp.617902-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6179
3.

国際会議録
国際会議録
3. Characterization of sensor performance and durability for structural health monitoring systems
Blackshire, J. L. ; Giurgiutiu, V. ; Cooney, A. ; Doane, J.
出版情報: Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA.  pp.66-75,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5770
4.

国際会議録
国際会議録
4. Noncontact NDE of microscopic surface-breaking cracks using laser generated and detected ultrasonic surface waves
Cooney, A. ; Blackshire, J.L.
出版情報: Nondestructive evaluation and health monitoring of aerospace materials and composites III : 16-17 March 2004, San Diego, California, USA.  pp.29-40,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5393
5.

国際会議録
国際会議録
5. Nondestructive characterization of micromachined ceramics
Cooney, A. ; Hix, K. E. ; Yaney, P. ; Zhan, Q. ; Dosser, L. R. ; Blackshire, J. L.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.141-149,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5766