1.

国際会議録
国際会議録
1. Environmental/Reliability Evaluations at Telecommunications Equipment Installations in Eastern Asia
Comizzoli, R.B. ; Jankoski, C.A. ; Peins, G.A. ; Psota-Kelty, L.A. ; Siconolfi, D.J. ; Sinclair, J.D. ; Chengen, W. ; Gao, M.
出版情報: Corrosion and corrosion protection : proceedings of the international symposium.  pp.691-705,  2001.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2001-22
2.

国際会議録
国際会議録
2. RELIABILITY CHARACTERIZATION OF RuO2 THIN FILM RESISTORS
Garfias, L.F. ; Siconolfi, D.L. ; Crane, G.R. ; Comizzoli, R.B. ; Peins, G.A.
出版情報: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.217-230,  1999.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-29
3.

国際会議録
国際会議録
3. RELIABILITY OF ELECTRONICS IN HARSH ENVIRONMENTS; ELECTRICAL LEAKAGE AND CORROSION CAUSED BY HYGROSCOPIC POLLUTANT PARTICLES
Comizzoli, R.B. ; Jankoski, C.A. ; Peins, G.A. ; Psota-Kelty, L.A. ; Siconolfi, D.J ; Sinclair, J.D.
出版情報: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.186-193,  1999.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-29
4.

国際会議録
国際会議録
4. CORROSION OF ALUMINUM INTERCONNECT PASSIVATED WITH POLYIMIDE OR SILICON NITRIDE
Comizzoli, R.B. ; Opila, R.L. ; Wong, Y.H.
出版情報: Electronic packaging materials science IV : symposium held April 24-28, 1989, San Diego, California, U.S.A..  pp.277-282,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 154
5.

国際会議録
国際会議録
5. Qualification of a Submicron Dust Particle Exposure Chamber for Life Testing Integrated Circuits, Components and Electronic Assemblies
Comizzoli, R.B. ; Frankenthal, R.P. ; Peins, G. A. ; Psota-kelty, L. A. ; Siconolf, D. J. ; Sinclair, J. D.
出版情報: Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices.  pp.223-230,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-29
6.

国際会議録
国際会議録
6. DEGRADATION OF MATERIALS BY EMITTANTS FROM BURNING KUWAITI OIL
Graedel, T.E. ; Comizzoli, R.B. ; Franey, J.P. ; Kammlott, G.W. ; Miller, A.E. ; Muller, A.J. ; Peins, G.A. ; Psota-Kelty, L.A. ; Sinclair, J.D. ; Sproles, E.S., Jr. ; Wetzel, R.C. ; Baer, N.S.
出版情報: Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices.  pp.449-462,  1993.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1993-1
7.

国際会議録
国際会議録
7. High Quality Silicon Oxide Dielectric Films By Molecular Beam Deposition
Chand, Naresh ; Kola, R.R. ; Opila, R.L. ; Comizzoli, R.B. ; Krautter, H. ; Chu, S.N.G. ; Osenbach, J.W.
出版情報: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.356-370,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-6