Pavanello, M. A. ; Martino, J. A. ; Simoen, E. ; Claeys, C.
出版情報:
Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium. pp.21-26, 2004. Pennington, N.J.. Electrochemical Society
Mercha, A. ; Simoen, E. ; Decoutere, S. ; Claeys, C.
出版情報:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.193-207, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Lukyanchikova, N. R. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Mercha, A. ; Claeys, C.
出版情報:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.208-214, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
出版情報:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.257-262, 2002. Warrendale, Pa. Materials Research Society
Claeys, C. ; Ikegami, M. ; Kobayashi, K. ; Nakabayashi, M. ; Ohyama, H. ; Simoen, E. ; Sunaga, H. ; Takami, Y. ; Takizawa, H. ; Yoneoka, M.
出版情報:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A29.3-, 2001. Warrendale. Materials Research Society
Evtukh, A. ; Kizjak, A. ; Litovchenko, V. ; Claeys, C. ; Simoen, E.
出版情報:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.221-226, 2005. Dordrecht. Kluwer Academic Publishers
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
Lukyanchikova, N. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Claeys, C.
出版情報:
Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.255-260, 2005. Dordrecht. Kluwer Academic Publishers
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.420-439, 2003. Pennington, NJ. Electrochemical Society
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