1.

国際会議録
国際会議録
1. GaInSbAs/AlInSbAs vertical-cavity surface-emitting laser(VCSEL)for operation at 1.5 ｦﾌm
Linnik,M. ; Christou,A.
出版情報: Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA.  pp.740-746,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3625
2.

国際会議録
国際会議録
2. Highly reflective Bragg mirrors for VCSEL applications at 1.3 and 1.55ｦﾌm
Linnik,M. ; Christou,A.
出版情報: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part2  pp.874-881,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3944
3.

国際会議録
国際会議録
3. TEM Study of Inversion Antiphase Domain Boundaries on GaAs/Si Interphase Grown by MBE
Stoemenos,J. ; Komninou,Ph. ; Karakostas,Th. ; Georgakilas,A. ; Christou,A.
出版情報: Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992.  pp.631-634,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 126-128
4.

国際会議録
国際会議録
4. Radiochromic gel-core fluorinated-polyethylene-propylene fiber optics for distributed sensing of x and gamma rays
Al-Sheikhly,M. ; McLaughlin,W.L. ; Hsu,C.-K. ; Christou,A.
出版情報: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.292-300,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2808
5.

国際会議録
国際会議録
5. UV,soft x-ray,and gamma-ray high-resolution imaging and discrimination by a novel photopolymer film system
Al-Sheikhly,M. ; McLaughlin,W.L. ; Christou,A. ; Christou,C.A.
出版情報: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.284-291,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2808
6.

テクニカルペーパー
テクニカルペーパー
6. Application of Symplectic Filters for High-Precision Orbit Estimation on Small Satellites
Christou,A. ; Palmer,P. ; Hashida,Y.
出版情報: A collection of technical papers : AIAA Guidance, Navigation and Control Conference, Montreal, Canada 6-9 August 2001.  Pt. 3  pp.1967-1973,  2001.  Reston, VA.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : AIAA Guidance Navigation and Control Conference
シリーズ巻号: 2001
7.

国際会議録
国際会議録
7. GaAs-on-Si MSM photodetector: FET receiver characterization and reliability
Feng,T. ; Dimoulas,A. ; Christou,A.
出版情報: Optoelectronic Interconnects V.  pp.53-57,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3288
8.

国際会議録
国際会議録
8. Thermal management of free space optical interconnects
Strifas,N. ; Christou,A.
出版情報: Optoelectronic Interconnects and Packaging IV.  pp.28-37,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3005
9.

国際会議録
国際会議録
9. Reliability of commercial optical interconnect systems
Strifas,N. ; Pusarla,C. ; Christou,A.
出版情報: Optoelectronic Interconnects and Packaging IV.  pp.54-57,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3005
10.

国際会議録
国際会議録
10. Effects of Bragg mirror interface grading and layer thickness variations on VCSEL performance at 1.55 μm
Linnik,M. ; Christou,A.
出版情報: Vertical-Cavity Surface-Emitting Lasers V.  pp.162-171,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4286