1.

国際会議録
国際会議録
1. Confinement of Nanocrystals and Possible Charge Storage Mechanism for MIS Memory Devices With Ge Nanocrystals Embedded in SiO2
Ho, V. ; Choi, W.K. ; Chim, W.K. ; Teo, L.W. ; Du, A.Y. ; Tung, C.H.
出版情報: Nanoparticles and nanowire buildings blocks--synthesis, processing, characterization and theory : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.299-304,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 818
2.

国際会議録
国際会議録
2. Length Effects On The Reliability Of Dual-Damascene Cu Interconnects
Wei, F. ; Gan, C.L. ; Thompson, C.V. ; Clement, J.J. ; Hau-Riege, S.P. ; Pey, K.L. ; Choi, W.K. ; Tay, H.L. ; Yu, B. ; Radhakrishnan, M.K.
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.645-650,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
3.

国際会議録
国際会議録
3. Effects of As Doping on Properties of ZnO Films
Huh, K.S. ; Hwang, D.K. ; Bang, K.H. ; Hong, M.K. ; Lee, D.H. ; Myoung, J.M. ; Oh, M.S. ; Choi, W.K.
出版情報: Progress in semiconductor materials for optoelectronic applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.649-654,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 692
4.

国際会議録
国際会議録
4. Manipulation Of Germanium Nanocrystals In A Tri-Layer Insulator Structure Of A Metal-Insulator-Semiconductor Memory Device
Teo, L.W. ; Heng, C.L. ; Ho, V. ; Tay, M. ; Choi, W.K. ; Chim, W.K. ; Antoniadis, D.A. ; Fitzgerald, E.A.
出版情報: Functional nanostructured materials through multiscale assembly and novel patterning techniques : symposium held April 2-5, 2002, San Francisco, California, U.S.A..  pp.103-216,  2002.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 728
5.

国際会議録
国際会議録
5. Study of Ge Out-Diffusion During Nickel (Platinum 〜 0, 5, 10 at.%) Germanosilicide Formation
Jin, L.J. ; Pey, K.L. ; Choi, W.K. ; Fitzgerald, E.A. ; Antoniadis, D.A. ; Pitera, A.J. ; Lee, M.L. ; Chi, D.Z.
出版情報: Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.141-146,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 810
6.

国際会議録
国際会議録
6. Multi-Via Electromigration Test Structures for Identification and Characterization of Different Failure Mechanisms
Choi, Z.-S. ; Chang, C.W. ; Lee, J.H. ; Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K.
出版情報: Materials, technology and reliability of advanced interconnects - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.271-276,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 863
7.

国際会議録
国際会議録
7. Experimental Characterization Of The Reliability Of 3-Terminal Dual-Damascene Copper Interconnect Trees
Gan, C.L. ; Thompson, C.V. ; Pey, K.L. ; Choi, W.K. ; Wei, F. ; Yu, B. ; Hau-Riege, S.P.
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.431-438,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
8.

国際会議録
国際会議録
8. Structural and Electrical Characterizations of Oxynitride Films on Solid Phase Epitaxially Grown Silicon Carbide
Bera, L.K. ; Choi, W.K. ; McNeill, D. ; Ray, S.K. ; Chatterjee, S. ; Maiti, C.K.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
9.

国際会議録
国際会議録
9. Oxidation Study Of Hydrogenated Amorphous Silicon Carbide Films
Choi, W.K. ; Lee, L.P. ; Leoy, C.C.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
10.

国際会議録
国際会議録
10. Factors Affecting Ge Nanocrystal Size in Co-Sputtered Ge+SiO2 Films
Choi, W.K. ; Ng, V. ; Ho, Y. W. ; Chen, T. B. ; Ho, V.
出版情報: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 638