Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.77-81, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Developments in x-ray tomography : 28-29 July 1997, San Diego, California. pp.203-212, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California. pp.375-381, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.134-138, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.87-91, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.119-124, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.92-98, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan. pp.100-104, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Three-dimensional and multidimensional microscopy : image acquisition processing VII : 23-24 January 2000, San Jose, California. pp.2-8, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.186-190, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering