Display technologies III : 26-27 July 2000, Taipei, Taiwan. pp.51-54, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Display technologies II : 9-11 July 1998, Taipei, Taiwan. pp.159-162, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Display technologies III : 26-27 July 2000, Taipei, Taiwan. pp.101-109, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Display technologies III : 26-27 July 2000, Taipei, Taiwan. pp.94-100, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XV. pp.562-571, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Microelectronic Structures and Microelectromechanical Devices for Optical Processing and Multimedia Applications. pp.140-144, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Microelectronic Structures and Microelectromechanical Devices for Optical Processing and Multimedia Applications. pp.145-152, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering