In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK. pp.49-56, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Terahertz spectroscopy and applications : 25-26 January 1999, San Jose, California. pp.14-21, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California. pp.226-234, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.74-81, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.240-242, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems : 6-7 November 1996, Beijing, China. pp.158-161, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.138-145, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Lasers in medicine and dentistry : diagnostics and treatment : 4-5 November 1996, Beijing, China. pp.54-58, 1996. Bellingham, Wash.,. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering