1.

国際会議録
国際会議録
1. Quantitative imaging of OH concentrations in a swirling methane jet flame via single-pulse laser-induced predissociative fluorescence
Chao,Y.-C. ; Wu,D.-C. ; Cheng,T.-S.
出版情報: Advanced sensors and monitors for process industries and the environment : 4-5 November 1998, Boston, Massachusetts.  pp.95-101,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3535
2.

国際会議録
国際会議録
2. Novel method to calculate the probability of silicon damage of DRAM based on the process control capability
King,M. ; Leu,J.-C. ; Chen,S.-S. ; Chao,Y.-C.
出版情報: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing.  pp.158-166,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3215
3.

国際会議録
国際会議録
3. SOG etch-back process induced surface roughness
Chu,P.-T. ; Chen,S.-F. ; Wu,J.-S. ; Hung,C.-C. ; Lin,T.-H. ; Chao,Y.-C.
出版情報: Microelectronic Device and Multilevel Interconnection Technology II.  pp.285-292,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2875