1.

国際会議録
国際会議録
1. Electrochemistry, Near-IR and ESR spectroscopy of RxC60 where R=H, CH3C6H5CH2 or o-XYLYL
Kadish, K. ; Boulas, P. ; Vijavashree, M. ; Subramanian, R. ; Cao, X. ; Mead, S. ; Tan, Z. ; Jones, M.
出版情報: Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials.  pp.213-228,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-10
2.

国際会議録
国際会議録
2. The Effect of N2 Plasma Damage on DC and RF Characteristics of HEMTs
Luo, B. ; Trivedi, V.P. ; Ren, F. ; Hsu, C.H. ; Pearton, S.J. ; Abernathy, C.R. ; Cao, X. ; Wu, C.S. ; Hoppe, M. ; Sasserath, J. ; Lee, J.W.
出版情報: High Speed Compound Semiconductor Devices for Wireless Applications and State-of-the-Art Program on Compound Semiconductors (XXXIII) : proceedings of the International Symposium.  pp.158-170,  2000.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2000-18
3.

国際会議録
国際会議録
3. Oxidation Induced Crystalline Defects in Bonded SOI Wafers
Papakonstantinou, P. ; Somasundram, K. ; Cao, X. ; Quinn, C. ; Yallup, K. ; Nevin, W.A. ; Blackstone, S.
出版情報: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.178-186,  1999.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-35
4.

国際会議録
国際会議録
4. Measurement of large aspherical mirrors using coordinate measurement machine during the grinding process [6148-18]
Jing, H. ; Kuang, L. ; Fan, T. ; Cao, X.
出版情報: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : Large mirrors and telescopes :2-5 November 2005, Xian, China.  pp.61480I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6148
5.

国際会議録
国際会議録
5. Design and simulation of a novel piezoresistive accelerometer for high accuracy and overload ability
Zhang, W. ; Cao, X. ; Liu, B. ; Zhang, D.
出版情報: Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China.  pp.184-187,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4600
6.

国際会議録
国際会議録
6. A Novel Resin Design for Styrenic Resin-Based Room Temperature Vacum Infusion Resin Transfer Molding-SCRIMP
Li, L. ; Cao, X. ; Lee, L. J.
出版情報: ANTEC 2001, conference proceedings, Dallas, Texas, May 6-10.  pp.852-856,  2001.  Brookfield Center, CT.  Society of Plastics Engineers
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 47
7.

国際会議録
国際会議録
7. Effect of Co-Promoter and Secondary Monomer on Shrinkage Control of Unsaturated Polyester Resins Cured at Low Temperatures
Cao, X. ; Lee, L. J.
出版情報: ANTEC 2001, conference proceedings, Dallas, Texas, May 6-10.  pp.3659-3663,  2001.  Brookfield Center, CT.  Society of Plastics Engineers
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 47
8.

国際会議録
国際会議録
8. LITHIUM-7 NMR STUDIES OF Li1-xCoO2 BATTERY CATHODES
Ouyang, B. ; Cao, X. ; Lin, H. W. ; Slane, S. ; Kostov, S. ; denBoer, M. ; Greenbaum, S. G.
出版情報: Solid state ionics IV : symposium held November 28-December 1, 1994, Boston, Massachusetts, U.S.A..  pp.59-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 369
9.

国際会議録
国際会議録
9. A Novel Technique for RTP Annealing of Compound Semiconductors
Fu, M. ; Sarvepalli, V. ; Singh, R. K. ; Abernathy, C. R. ; Cao, X. ; Pearton, S. J. ; Sekhar, J. A.
出版情報: Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.345-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 483
10.

国際会議録
国際会議録
10. Research of digital image characteristics using computer
Cao, X. ; Ni, X. ; Xu, J.
出版情報: Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China.  pp.278-286,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5637