1.

国際会議録
国際会議録
1. Extraction of Elm Sparse Woodlands from GF-2 Image Based on GEOBIA in Zhenglan Banner, Inner Mongolia
C. Xue ; Z. Gao ; B. Sun
出版情報: Proceedings of Dragon 3 Final Results & Dragon 4 Kick-Off Symposium : 4-8 July 2016 Wuhan, PR China.  2016.  Noordwijk.  ESA Communications
シリーズ名: ESA SP
シリーズ巻号: 739
2.

国際会議録
国際会議録
2. Surfactants Effect on the Photoactivity of Fe-Doped TiO2
Q.Y. Chen ; C. Xue ; X.L. Li ; Y.H. Wang
出版情報: Energy and Environment Materials : Selected, peer reviewed papers from the Chinese Materials Congress 2012 (CMC 2012), July 13-18, 2012, Taiyuan, China.  pp.367-371,  2013.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 743-744
3.

国際会議録
国際会議録
3. Surface Damages Generated in Hole Making of a Cast Nickel-Based Alloy
C. Xue ; W.Y. Chen
出版情報: Advances in materials manufacturing science and technology XIV : selected, peer reviewed papers from the 14th International Manufacturing Conference in China (IMCC2011), October 13-15, 2011, Tianjin, China.  pp.57-60,  2011.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 697-698
4.

国際会議録
国際会議録
4. Research on special prism processing craft
C. Xue ; F. Huo ; H. Lv
出版情報: Advanced optical manufacturing technologies.  1  pp.67221M-1-67221M-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6722
5.

国際会議録
国際会議録
5. Research of fabrication and testing technology of monocrystalline silicon optical elements with super-smooth surfaces
C. Xue ; F. Huo ; C. Zhou
出版情報: Optical test and measurement technology and equipment.  1  pp.67231U-1-67231U-6,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6723
6.

国際会議録
国際会議録
6. Method for testing aspheric surface with wavelength scanning interferometry
C. Xue ; F. Huo ; H. Lv
出版情報: Optical test and measurement technology and equipment.  1  pp.67231V-1-67231V-7,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6723
7.

国際会議録
国際会議録
7. Research on the measuring method of the slope error of EUV/x-ray optical elements and measuring apparatus of long trace profiler
C. Xue ; F. Huo ; C. Zhou ; W. Deng
出版情報: Optical test and measurement technology and equipment.  1  pp.67231W-1-67231W-6,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6723
8.

国際会議録
国際会議録
8. Optical design of long focal length and wide field on an aerial CCD camera
X. Cheng ; Y. Che ; C. Xue
出版情報: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies.  1  pp.72821K-1-72821K-6,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7282
9.

国際会議録
国際会議録
9. Determination of optical constants in the VUV range for fluoride thin films
C. Xue ; K. Yi ; C. Wei ; J. Shao ; Z. Fan
出版情報: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  1  pp.72831E-1-72831E-8,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7283
10.

国際会議録
国際会議録
10. The measurement and system error analysis of diopter and optical parallax in optical pointing system
W. Cao ; C. Xue ; L. Li ; Z. An
出版情報: International Symposium on Photoelectronic Detection and Imaging 2007, optoelectronic system design, manufacturing, and testing : 9-12 September 2007, Beijing China.  pp.66241G-1-66241G-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6624