Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma
- 著者名:
- R. Lupan ( Univ. d'Angers, France )
- A. Kobi ( Univ. d'Angers, France )
- C. Robledo ( Univ. d'Angers, France )
- I. Bacivarov ( Politehnica Univ. of Bucharest, Romania )
- A. Bacivarov ( Politehnica Univ. of Bucharest, Romania )
- 掲載資料名:
- Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 7297
- 発行年:
- 2009
- 開始ページ:
- 72972L-1
- 終了ページ:
- 72972L-6
- 総ページ数:
- 6
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819475596 [0819475599]
- 言語:
- 英語
- 請求記号:
- P63600/7297
- 資料種別:
- 国際会議録
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