Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma

著者名:

R. Lupan ( Univ. d'Angers, France )
A. Kobi ( Univ. d'Angers, France )
C. Robledo ( Univ. d'Angers, France )
I. Bacivarov ( Politehnica Univ. of Bucharest, Romania )
A. Bacivarov ( Politehnica Univ. of Bucharest, Romania )

掲載資料名:

Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7297

発行年:

2009

開始ページ:

72972L-1

終了ページ:

72972L-6

総ページ数:

6

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475596 [0819475599]

言語:

英語

請求記号:

P63600/7297

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052808
シリーズID:	PA00000029
会議名:	Optolectronics, Microelectronics, and Nanotechnologies
回次:	2008 : 4th
会議開催地:	Constanta, Romania
会議開催年:	2008.08.28-2008.08.31
論文注記:	Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 28-31 August 2008, Constanta, Romania - Instruments, Sensors and Microsystems, 72972L, 7297-94

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