1.

国際会議録
国際会議録
1. Applications of Through Process Modelling Developed in VIRSTAR
C. Liu ; J. Go ; W.S. Miller ; M. van der Winden
出版情報: Fundamentals of deformation and annealing : proceedings of the International Symposium held to coincide with the retirement of Professor John Humphreys in Manchester, UK, 5th-7th September 2006.  pp.119-128,  2007.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 550
2.

国際会議録
国際会議録
2. Micro-Raman Studies on Nickel Germanides Formed on (110) Crystalline Ge
C. Peng ; C. Huang ; Y. Yang ; C. Liu
出版情報: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.249-253,  2008.  Pennington, NJ.  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 16(10)
3.

国際会議録
国際会議録
3. Geometric correction and pan-sharpening data fusion of QuickBird ortho ready standard imagery
B. Shi ; N. Chen ; C. Liu
出版情報: Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6752
4.

国際会議録
国際会議録
4. Method of video capture port design for IP camera
L. Zhang ; S. Ruan ; M. Zhang ; C. Liu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63573R-1-63573R-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
5.

国際会議録
国際会議録
5. Key techniques for vision measurement of 3D object surface
H. Yang ; S. Zhang ; G. Guo ; C. Liu ; R. Yu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63571Z-1-63571Z-7,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
6.

国際会議録
国際会議録
6. Research on applying constant current to control the EOF in microfluidic chips
M. Yang ; C. Liu ; J. Li ; G. Chen ; C. Wu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63573C-1-63573C-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
7.

国際会議録
国際会議録
7. Throughput analysis of IEEE 802.11-based ad hoc networks in the presence of a selfish node
C. Liu ; Y. Shu ; S. Wang ; L. Dong ; Y. Xu
出版情報: Next-generation communication and sensor networks, 2006 : 2-3 October, 2006, Boston, Massachusetts, USA.  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6387
8.

国際会議録
国際会議録
8. A novel description of refractive index in irregular inhomogeneous optical medium
C. Liu ; X. Yin ; T. Zhang ; S. Deng ; X. Li
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63571E-1-63571E-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
9.

国際会議録
国際会議録
9. A new fiber Bragg grating accelerometer
L. Teng ; L. Feng ; H. Lin ; B. Zhang ; C. Liu
出版情報: Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo -Electronic Technology, and Artificial Intelligence : 13-15 October 2006, Beijing, China.  pp.63574C-1-63574C-6,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6357
10.

国際会議録
国際会議録
10. Wireless network traffic modeling based on extreme value theory
C. Liu ; Y. Shu ; O. W. W. Yang ; J. Liu ; L. Dong
出版情報: Next-generation communication and sensor networks, 2006 : 2-3 October, 2006, Boston, Massachusetts, USA.  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6387