1.

国際会議録
国際会議録
1. INVESTIGATION OF THE HOMOGENEITY AND DEFECT STRUCTURE IN SEMI-INSULATING LEC GaAs SINGLE CRYSTALS BY SYNCHROTRON RADIATION DOUBLE CRYSTAL X-RAY TOPOGRAPHY
Barnett, Sx. J. ; Tanner, B. K. ; Brown, G. T.
出版情報: Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A..  pp.83-88,  1985.  Pittsburgh.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 41
2.

国際会議録
国際会議録
2. X-RAY DIFFRACTION AND SIMS STUDIES OF MBE GROWN DOPING SUPERLATTICES IN SILICON
Brown, G. T. ; Barnett, S. J. ; Blackmore, G. W. ; Courtney, S. J. ; Houghton, D. C.
出版情報: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.289-294,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 102
3.

国際会議録
国際会議録
3. OBSERVATION OF DAMAGE STRUCTURES IN PROTON-IMPLANTED GALLIUM ARSENIDE BY CROSS-SECTIONAL TEM
Loretto, D. ; Brown, G. T. ; Jones, I. P.
出版情報: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.133-138,  1987.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 82