1.

国際会議録
国際会議録
1. DISTRIBUTION OF BORON ATOMS INN ION IMPLANTED COMPOUND SEMICONDUCTORS
Bowman, Jr., R.C. ; Knudsen, J.F. ; Downing, R.C. ; Kremer, R.E.
出版情報: Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.89-92,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 126
2.

国際会議録
国際会議録
2. STRUCTURAL CHARACTERIZATION OF ION BEAM ENHANCED SOLID PHASE EPITAXIAL REGROWTH BY RAMAN, RBS, AND X-RAY ANALYSIS
Knudsen, John F. ; Bowman, Jr., R.C. ; Adams, P.M. ; Newman, R. ; Hurrell, J.P. ; Cole, R.C. ; Halle, L.F. ; Barker, D.H.
出版情報: Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.177-182,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 126
3.

国際会議録
国際会議録
3. STRUCTURAL CHARACTERIZATIONS OF SYMMETRICALLY STRAINED SimGen SUPERLATTICES
Bowman, Jr., R.C. ; Adams, P.M. ; Ahn, C.C. ; Chang, S.J. ; Arbet, V. ; Wang, K.L.
出版情報: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.101-106,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 160
4.

国際会議録
国際会議録
4. X-RAY AND RAMAN TOPOGRAPHIC STUDIES OF GaAs IMPLANTED WITH 28Si+ AND PULSED LASER ANNEALED
Bowman, Jr., R.C. ; Knudsen, J.F. ; Adams, P.M. ; Yao, H.D. ; Compaan, A.D.
出版情報: Beam-solid interactions : physical phenomena : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.727-732,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 157