International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland. pp.323-338, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 2 pp.1139-1149, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida. pp.382-395, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced technology MMW, radio, and terahertz telescopes : 26-28 March 1998, Kona, Hawaii. pp.297-304, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced technology MMW, radio, and terahertz telescopes : 26-28 March 1998, Kona, Hawaii. pp.326-334, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany. Part2 pp.1298-1304, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.278-285, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.262-275, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.146-153, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering