Three-dimensional imaging, optical metrology, and inspection V : 19-20 September 1999, Boston, Massachusetts. pp.177-183, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advances in optical information processing VII : 10-11 April 1996, Orlando, Florida. pp.198-207, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts. pp.2-12, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA. pp.129-135, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II. pp.44-49, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional Imaging, Optical Metrology, and Inspection IV. pp.13-20, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Three-Dimensional Imaging, Optical Metrology, and Inspection IV. pp.21-26, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering