1.

国際会議録
国際会議録
1. Comparison between Measurement Techniques Used for Determination of the Micropipe Density in SiC Substrates
Emorhokpor, E. ; Carlson, E. ; Wan, J. ; Weber, A. ; Basceri, C. ; Jenny, J.R. ; Sandhu, R. ; Oliver, J.D. ; Burkeen, F. ; Somanchi, A. ; Velidandla, V. ; Orazio, F. ; Blew, A. ; Goorsky, M.S. ; Dudley, M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.443-446,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Growth of Micropipe-Free Single Crystal Silicon Carbide (SiC) Ingots via PhySiCal Vapor Transport (PVT)
Basceri, C. ; Khlebnikov, I. ; Khlebnikov, Y. ; Muzykov, P. ; Sharma, M. ; Stratiy, G. ; Silan, M. ; Balkas, C.M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.39-42,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. Dielectric Behavior of CVD (Ba, Sr)TiO3 Thin Films on Pt/Si
Streiffer, S. K. ; Basceri, C. ; Kingon, A. I. ; Lipa, S. ; Bilodeau, S. ; Carl, R. ; Buskirk, P. C. Van
出版情報: Metal-organic chemical vapor deposition of electronic ceramics II : symposium held on November 27-29 1995, Boston, Massachusetts, U.S.A..  pp.219-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 415
4.

国際会議録
国際会議録
4. Electrical Properties of Integrated Ta2O5 Metal-Insulator-Metal Capacitors
Martin, B. C. ; Basceri, C. ; Streiffer, S. K. ; Kingon, A. I.
出版情報: Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.101-,  1998.  Warrendale, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 500
5.

国際会議録
国際会議録
5. An Important Failure Mechanism in MOCVD (Ba,Sr)TiO3 Thin Films: Resistance Degradation
Basceri, C. ; Lash, S. E. ; Parker, C. B. ; Streiffer, S. K. ; Kingon, A. I. ; Grossmann, M. ; Hoffmann, S. ; Schumacher, M. ; Waser, R. ; Bilodeau, S. ; Carl, R. ; Buskirk, P. C. Van ; Summerfelt, S. R.
出版情報: Ferroelectric thin films VI : symposium held November 30-December 4, 1997, Boston, Massachusetts, U.S.A..  pp.9-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 493
6.

国際会議録
国際会議録
6. Leakage Currents in CVD (Ba,Sr)TiO3 Thin Films
Basceri, C. ; Streiffer, S. K. ; Kingon, A. I. ; Bilodeau, S. ; Carl, R. ; Buskirk, P. C. van ; Summerfelt, S. R. ; McIntyre, P. ; Waser, R.
出版情報: Ferroelectric thin films V : symposium held April 7-12, 1996, San Francisco, California, U.S.A..  pp.285-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 433