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New principles of diagnostics of surface parameters of solids by methods of x-ray total external reflection

著者名:
掲載資料名:
Sixth International Conference on Correlation Optics : 16-19 September 2003, Chernivtsi, Ukraine
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5477
発行年:
2004
開始ページ:
198
終了ページ:
205
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454034 [0819454036]
言語:
英語
請求記号:
P63600/5477
資料種別:
国際会議録

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