14 MeV Neutron-Induced SEU in SRAM Devices
- 著者名:
- 掲載資料名:
- Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 536
- 発行年:
- 2004
- 開始ページ:
- 649
- 終了ページ:
- 652
- 総ページ数:
- 4
- 出版情報:
- Noordwijk, the Netherlands: ESA Publication Division
- ISSN:
- 03796566
- ISBN:
- 9789290928461 [9290928468]
- 言語:
- 英語
- 請求記号:
- E11690/536
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
3
国際会議録
Single Event Upset Sensitivity of a SRAM: An Overview from Testing Procedures to Device Hardening
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
ESA Publication Division |
Materials Research Society |
Electrochemical Society |