Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.635212-635212, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Acid-base catalysis II : proceedings of the International Symposium on Acid-Base Catalysis II, Sapporo, December 2-4, 1993. pp.135-, 1994. Tokyo. Elsevier
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Nanoengineering: fabrication, properties, optics, and devices : 4-6 August, 2004, Denver, Colorado. pp.150-157, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA. pp.464-473, 2004. Bellingham. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Okamoto, M. ; Chino, K. ; Baba, T. ; Izumida, T. ; Kawamura, F. ; Kikuchi, M.
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Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.741-746, 1990. Pittsburgh, Pa.. Materials Research Society
Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63520R-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Watanabe, H. ; Baba, T. ; Yokohama National Univ. (Japan)
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Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.635208-635208, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering