1.

国際会議録
国際会議録
1. ORIENTATIONAL AND MICROSTRUCTURAL EVOLUTION DURING EPITAXIAL GROWTH OF Cu ON Si(001) BY SPUTTER DEPOSITION
Hashim, I. ; Park, B. ; Atwater, H.A.
出版情報: Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.327-332,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 280
2.

国際会議録
国際会議録
2. Research Opportunities in Crystalline Silicon Photovoltaics for the 21st Century
Atwater, H.A. ; Sopori, B. ; Ciszek, T. ; Feldman, L,C. ; Gee, J. ; Rohatgi, A.
出版情報: Photovoltaics for the 21st century : proceedings of the international symposium.  pp.206-218,  1999.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-11
3.

国際会議録
国際会議録
3. Quantitative Modelling of Nucleation Kinetics in Experiments for Poly-Si Growth on SiO 2 by Hot-Wire Chemical Vapor Deposition
Swiatek, M ; Holt, J.K. ; Atwater, H.A.
出版情報: Photovoltaics for the 21st century II : proceedings of the international symposium.  pp.275-281,  2001.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2001-10
4.

国際会議録
国際会議録
4. Gas Phase and Surface Kinetic Processes in Polycrystalline Silicon Hot-Wire Chemical Vapor Deposition
Holt, J.K. ; Swiatek, M. ; Goodwin, D.G. ; Atwater, H.A. ; Muller, R.P. ; Goddard, W.A., III
出版情報: Photovoltaics for the 21st century II : proceedings of the international symposium.  pp.240-252,  2001.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2001-10
5.

国際会議録
国際会議録
5. A SYSTEMATIC METHOD FOR EXTRACTING STRUCTURAL PARAMETERS FROM LOW ANGLE X-RAY REFLECTIVITY MEASUREMENTS ON MULTILAYERS
Goldman, L.M. ; Atwater, H.A. ; Spaepen,F.
出版情報: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.577-582,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 160
6.

国際会議録
国際会議録
6. *EVOLUTION OF SEMICONDUCTOR THIN FILM AND SURFACE MICROSTRUCTURE DURING ION BOMBARDMENT
Atwater, H.A.
出版情報: Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A..  pp.173-186,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 202
7.

国際会議録
国際会議録
7. STRAIN MODIFICATION AND THERMAL STABILITY OF SiX Ge1-X FILMS GROWN BY ION-ASSISTED MOLECULAR BEAM EPITAXY
Tsai, C.J. ; Atwater, H.A. ; Vreeland, T.
出版情報: Surface chemistry and beam-solid interactions : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.57-62,  1991.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 201
8.

国際会議録
国際会議録
8. An MBE and Modeling Study of Pulsed Growth on Ge(001)
Gallivan, M.A. ; Atwater, H.A.
出版情報: Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.285-290,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 749
9.

国際会議録
国際会議録
9. Surface plasmons for nanofabrication
Kik, P.G. ; Maier, S.A. ; Atwater, H.A.
出版情報: Micromachining technology for micro-optics and nano-optics II : 27-29 January 2004, San Jose, California, USA.  pp.215-223,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5347
10.

国際会議録
国際会議録
10. Structural transformations in self-assembled semiconductor quantum dots as inferred by transmission electron microscopy
Moeck, P. ; Lei, Y.Y. ; Topuria, T. ; Browning, N.D. ; Ragan, R. ; Kim, K.S. ; Atwater, H.A.
出版情報: Physical Chemistry of Interfaces and Nanomaterials.  pp.71-82,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4807