1.

国際会議録
国際会議録
1. Mobility spectrum techniques for characterizing multilayer semiconductors structures
Musca, C.A. ; Nguyen, T. ; Antoszewski, J. ; Redfern, D.A. ; Dell, J.M. ; Faraone, L.
出版情報: Design, characterization, and packaging for MEMS and microelectronics II : 17-19 December, 2001, Adelaide, Australia.  pp.314-321,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4593
2.

国際会議録
国際会議録
2. Determination of residual stress in low-temperature PECVD silicon nitride thin films
Martyniuk, M.P. ; Antoszewski, J. ; Musca, C.A. ; Dell, J.M. ; Faraone, L.
出版情報: Device and process technologies for MEMS, microelectronics, and photonics III : 10-12 December 2003, Perth, Australia.  pp.451-462,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5276
3.

国際会議録
国際会議録
3. HgCdTe long-wavelength infrared photovoltaic detectors formed by reactive ion etching
Nguyen, T.T. ; Dell, J.M. ; Musca, C.A. ; Antoszewski, J. ; Faraone, L.
出版情報: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.146-153,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4795
4.

国際会議録
国際会議録
4. Reactive Ion Etching (RIE)-Induced p- to n-Type Conversion in Extrinsically-Doped p-Type HgCdTe
Musca, C. A. ; Smith, E. P. G. ; Siliquini, J. F. ; Dell, J. M. ; Antoszewski, J. ; Piotrowski, J. ; Faraone, L.
出版情報: Infrared applications of semiconductors II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.353-,  1998.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 484
5.

国際会議録
国際会議録
5. Demonstration of Improved Quantitative Mobility Spectrum Analysis (i-QMSA)
Vurgaftman, I. ; Meyer, J. R. ; Hoffman, C. A. ; Redfern, D. ; Antoszewski, J. ; Faraone, L. ; Lindemuth, J. R.
出版情報: Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A..  pp.245-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 490
6.

国際会議録
国際会議録
6. Reactive Ion Etching (RIE)-Induced p- to n-Type Conversion in Extrinsically-Doped p-Type HgCdTe
Musca, C. A. ; Smith, E. P. G. ; Siliquini, J. F. ; Dell, J. M. ; Antoszewski, J. ; Piotrowski, J. ; Faraone, L.
出版情報: Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.631-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 487
7.

国際会議録
国際会議録
7. Determination of mechanical properties of silicon nitride thin films using nanoindentation
Martyniuk, M. ; Antoszewski, J. ; Walmsley, B. A. ; Musca, C. A. ; Dell, J. M. ; Jung, Y.　-G. ; Lawn, B. R. ; Huang, H. ; Faraone, L.
出版情報: Spaceborne sensors II : 28-29 March 2005, Orlando, Florida, USA.  pp.216-225,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5798
8.

国際会議録
国際会議録
8. Toward MEMS-based infrared tunable microspectrometers
Antoszewski, J. ; Dell, J.M. ; Shivalimar, T. ; Martyniuk, M. ; Winchester, K. ; Wehner, J. ; Musca, C.A. ; Faraone, L.
出版情報: Smart structures, devices, and systems : 16-18 December 2002 Melbourne, Australia.  pp.148-155,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4935
9.

国際会議録
国際会議録
9. A monolithically integrated HgCdTe SWIR photodetector and tunable MEMS-based optical filter
Antoszewski, J. ; Winchester, K. J. ; Keating, A. J. ; Nguyen, T. ; Silva, K. K. M. B. D. ; Huang, H. ; Musca, C. A. ; Deli, J. M. ; Faraone, L. ; Mitra, P. ; Beck, J. D. ; Skokan, M. R. ; Robinson, J. E.
出版情報: Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA.  pp.719-727,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5783
10.

国際会議録
国際会議録
10. Thermal Stability in HgCdTe IR Photodiodes
Dell, J.M. ; Nguyen, T. ; Musca, C.A. ; Antoszewski, J. ; Faraone, L. ; Pal, R.
出版情報: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.595-606,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 744