1.

国際会議録
国際会議録
1. Intense ion beams accelerated by relativistic laser plasmas
Roth,M. ; Cowan,T.E. ; Gauthier,J.-C. ; Allen,M. ; Audebert,P. ; Blazevic,A. ; Fuchs,J. ; Geissel,M. ; Hegelich,M. ; Karsch,S. ; Vehn,J.Meyer ter ; Pukhov,A. ; Schlegel,T.
出版情報: Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA.  pp.52-57,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4510
2.

国際会議録
国際会議録
2. Use and function of TXRF(total reflection x-ray fluorescence)for routine in fab metallic monitoring
Allen,M. ; Hossain,T.Z. ; Lebowitz,J.
出版情報: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland.  pp.157-161,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3743