1.

国際会議録
国際会議録
1. Application of laser wavelength standard to interferometry measurements in air with nanometric accuracy
Topcu,S. ; Wallerand,J.P. ; Alayli,Y. ; Juncar,P.
出版情報: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.125-132,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3945
2.

国際会議録
国際会議録
2. New remote gas infrared optical fiber sensor
Alayli,Y. ; Bendamardji,S. ; Huard,S.J.
出版情報: Microelectronic structures and MEMS for optical processing II : 14-15 October 1996, Austin, Texas.  pp.133-140,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2881
3.

国際会議録
国際会議録
3. Amplitude modulation fiber optic vibrometer with large bandwidth and nanometric accuracy
Dib,R. ; Alayli,Y. ; Wagstaff,P. ; Henrio,J.C.
出版情報: Fourth International Conference on Vibration Measurements by Laser Techniques : Advances and Applications : 21-23 June, 2000, Ancona, Italy.  pp.19-24,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4072
4.

国際会議録
国際会議録
4. Optical fiber profilometer with submicronic accuracy
Alayli,Y. ; Wang,D. ; Bonis,M.
出版情報: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II :23-24 September 1998 Santa Clara, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3509
5.

国際会議録
国際会議録
5. Noise and distortion analysis of microwave fiber optic links
Zahzouh,M. ; Rumelhard,C. ; Dueme,P. ; Schaller,M. ; Alayli,Y.
出版情報: Physics and Simulation of Optoelectronic Devices VI.  Part 2  pp.990-996,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3283
6.

国際会議録
国際会議録
6. Microelectronics planar technologies for the manufacturing of high spatial frequency gratings: sub-angstrom assessment of spatial coherence
Parriaux,O.M. ; Jourlin,Y. ; Pigeon,F. ; Bouchet,G. ; Dijk,P.W.Van ; Pellens,R.J. ; Topcu,S. ; Alayli,Y. ; Bonis,M.
出版情報: Lithographic and Micromachining Techniques for Optical Component Fabrication.  pp.209-216,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4440