Kametani, H. ; Akiyama, H. ; Yamaguchi, Y. ; Koumaru, M, ; Wei, L. ; Tabuki, Y. ; Tanigawa, S. ; Uedono, A. ; Watauchi, S. ; Ujihira, Y. ; Suzuki, R. ; Ohgaki, H. ; Mikado, T.
出版情報:
Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.. pp.235-240, 1992. Pittsburgh, Pa.. Materials Research Society
Wada, K. ; Koshiba, S. ; Noge, H. ; Akiyama, H. ; Sakaki, H.
出版情報:
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII). pp.332-335, 1995. Pennington, NJ. Electrochemical Society
Zhang, C. H. ; Ji, C. C. ; Shi, J. G. ; Katsuki, S. ; Kimura, A. ; Fukumoto, H. ; Akiyama, H.
出版情報:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.614905-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Otsuji, T. ; Okuda-Ashitaka, E. ; Kojima, S. ; Akiyama, H. ; Ito, S. ; Ohmiya, Y.
出版情報:
Genetically Engineered and Optical Probes for Biomedical Applications. pp.55-62, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering