1.

国際会議録
国際会議録
1. Microelectromechanical systems (MEMS) and their photonic application (Invited Paper)
Uenishi,Y. ; Akimoto,K. ; Nagaoka,S.
出版情報: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.374-381,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3098
2.

国際会議録
国際会議録
2. Study of Point Defects in Impurity-Doped ZnSe by a Monoenergetic Positron Beam
Miyajima,T. ; Wei,L. ; Tanigawa,S. ; Okuyama,H. ; Akimoto,K. ; Mori,Y.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.3  pp.1423-1426,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
3.

国際会議録
国際会議録
3. Origin of the Carrier Reduction by Annealing in n-Type ZnSe
Miyajima,T. ; Okuyama,H. ; Akimoto,K. ; Wei,L. ; Tanigawa,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.483-487,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
4.

国際会議録
国際会議録
4. Si/Ge Ordered Interface:Structure and Formation Mechanism
Ikarashi,N. ; Akimoto,K. ; Oshiyama,A. ; Tatsumi,T.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.511-516,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
5.

国際会議録
国際会議録
5. Transient thermal analysis of micromachined silicon bridge
Yuasa,H. ; Ohya,S. ; Karasawa,S. ; Kodato,S. ; Akimoto,K.
出版情報: Microlithography and Metrology in Micromachining II.  pp.280-287,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2880