Low-noise SOI Hall devices

Low-noise SOI Hall devices

著者名:

Haddab, Y. ( SchlumbergerSema (France) )

Mosser, V. ( SchlumbergerSema (France) )

Lysowec, M. ( SchlumbergerSema (France) )

Suski, J. ( SchlumbergerSema (France) )

Demeus, L. ( Univ. Catholique de Louvain (Belgium) )

Renaux, C. ( Univ. Catholique de Louvain (Belgium) )

Adriensen, S. ( Univ. Catholique de Louvain (Belgium) )

Flandre, D. ( Univ. Catholique de Louvain (Belgium) )

さらに 3 件

掲載資料名:

Noise and Information in Nanoelectronics, Sensors, and Standards

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5115

発行年:

2003

開始ページ:

196

終了ページ:

203

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449757 [081944975X]

言語:

英語

請求記号:

P63600/5115

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013103
シリーズID:	PA00000029
会議名:	International Symposium on Fluctuations and Noise : Noise and Information in Nanoelectronics, Sensors, and Standards
回次:	2003
会議開催地:	Santa Fe, NM, USA
会議開催年:	2003.06.02-2003.06.04

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2 国際会議録 Charge Injection Characterization of Thin-Film SOI MOS Transistors at High Temperature Picun, G., Demeus, L., Flandre, D. Electrochemical Society	8 国際会議録 Performance of Double-Gate SOI nMOSFETs at Low Temperature Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D. Electrochemical Society
3 国際会議録 N. DHalleweyn, J. Benson. M. Swanenbeig, W. Redman-Whizc A New Fully-Depleted SOI MOSFET Macro-Model Valid from DC to RF Raskin, B. Inilguez. J.P., Demeus, L., Neve, A., Goffioul, M., Simon, P., Vanhoenacker, D., Flandre, D. Electrochemical Society	9 テクニカルペーパー SOI Technology for Single-Chip Harsh Environment Microsystems Flandre, D., Laconte, J., Levacq, D., Afzalian, A., Rue, B., Renaux, C. American Institute of Aeronautics and Astronautics
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5 国際会議録 Low-Noise High-Temperature SOI Analog Circuits Dessard, V., Iniguez, B., Adriaensen, S., Flandre, D. Kluwer Academic Publishers	11 国際会議録 Recent advances in SOI MOSFET devices and circuits for ultra-low power / high temperature applications Levacq, D., Dessard, V., Flandre, D. Kluwer Academic Publishers
6 国際会議録 The Length-Dependence of the 1/f Noise of Graded-Channel SOI nMOSFETs E. Simoen, C. Claeys, T. M. Chung, D. Flandre, J. Raskin Electrochemical Society	12 国際会議録 Low temperature and channel engineering influence on harmonic distortion of SOI NMOSFETs for analog applications Pavanello, M.A., Cerdeira, A., Aleman, M.A., Martino, J.A., Vancaillie, L., Flandre, D. Electrochemical Society

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