1.

国際会議録
国際会議録
1. Mosaicity and Wafer Bending in SiC Wafers as Measured by Double and Triple Crystal X-Ray Rocking Curve and Peak Position Maps
K.W. Kirchner ; K.A. Jones ; M.A. Derenge ; M. Dudley ; A.R. Powell
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.213-218,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557
2.

国際会議録
国際会議録
2. Bulk Growth of Large Area SiC Crystals
A.R. Powell ; J.J. Sumakeris ; Y. Khlebnikov ; M.J. Paisley ; R.T. Leonard
出版情報: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.5-10,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 858
3.

国際会議録
国際会議録
3. Dislocation Characterization in 4H-SiC Crystals
J.J. Sumakeris ; R.T. Leonard ; E. Deyneka ; Y. Khlebnikov ; A.R. Powell
出版情報: Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy.  pp.393-396,  2016.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 858
4.

国際会議録
国際会議録
4. 100 mm 4HN-SiC Wafers with Zero Micropipe Density
R.T. Leonard ; Y. Khlebnikov ; A.R. Powell ; C. Basceri ; M.F. Brady
出版情報: Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007.  pp.7-10,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 600-603
5.

国際会議録
国際会議録
5. Exploration of Bulk and Epitaxy Defects in 4H-SiC Using Large Scale Optical Characterization
R.T. Leonard ; M.J. Paisley ; S. Bubel ; J.J. Sumakeris ; A.R. Powell ; Y. Khlebnikov ; J.C. Seaman ; J. Ambati ; A.A. Burk ; M.J. O'Loughlin ; E. Balkas
出版情報: Silicon Carbide and Related Materials 2016.  pp.226-232,  2017.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 897