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Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis

著者名:
S. Hong ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
G. Onushkin ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
J. S. Park ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
B. K. Kim ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
D. Lee ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
A. Fomin ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
K. Ko ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
J. W. Kim ( Samsung Electro-Mechanics Co., Ltd. (South Korea) )
さらに 3 件
掲載資料名:
Gallium nitride materials and devices II : 22-25 January 2007, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6473
発行年:
2007
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819465863 [0819465860]
言語:
英語
請求記号:
P63600/6473
資料種別:
国際会議録

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