Calibration results for the AXAF flight contamination monitor
- 著者名:
Elsner, R.F. ( NASA Marshall Space Flight Center ) O'Dell, S.L. Ramsey, B.D. Tennant, A.F. Weisskopf, M.C. Kolodziejczak, J.J. Swartz, D.A. Engelhaupt, D.E. Garmire, G.P. Nousek, J.A. Bautz, M.W. Gaetz, T.J. Zhao, P. - 掲載資料名:
- X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3444
- 発行年:
- 1998
- 開始ページ:
- 177
- 終了ページ:
- 188
- 出版情報:
- Bellingham, Wash.: SPIE
- ISSN:
- 0277786X
- ISBN:
- 9780819428998 [081942899X]
- 言語:
- 英語
- 請求記号:
- P63600/3444
- 資料種別:
- 国際会議録
類似資料:
SPIE |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |