1.

国際会議録
国際会議録
1. Tests of the sensitivity and mass range of a 50-MHz quartz crystal microbalance(QCM)
Wallace,S.A. ; Wallace,D.A. ; Wood,B.E.
出版情報: Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado.  pp.109-116,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3784
2.

国際会議録
国際会議録
2. Satellite contamination and materials outgassing effects databases
Wood,B.E. ; Green,B.D. ; Uy,O.M. ; Cain,R.P. ; Thorpe,J.
出版情報: Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado.  pp.16-23,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3784
3.

国際会議録
国際会議録
3. QCM flight measurements of contaminant films and their effect on Midcourse Space Experiment (MSX) satellite optics
Wood,B.E. ; Hall,D.F. ; Lesho,J.C. ; Uy,O.M. ; Dyer,J.S. ; Green,B.D. ; Galica,G.E. ; Boies,M.T. ; Silver,D.M. ; Benson,R.C. ; Erladson,R.E. ; Bertrand,W.T.
出版情報: Photonics for space environments V : 30 July 1997, San Diego.  pp.34-40,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3124
4.

国際会議録
国際会議録
4. Effect of the polar auroral regions on the Midcourse Space Experiment cold cathode pressure sensor
Boies,M.T. ; Phillips,T.E. ; Erlandson,R.E. ; Silver,D.M. ; Benson,R.C. ; Lesho,J.C ; Uy,O.M. ; Green,B.D. ; Galica,G.E. ; Dyer,J.S. ; Wood,B.E. ; Hall,D.F.
出版情報: Photonics for space environments V : 30 July 1997, San Diego.  pp.103-115,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3124
5.

国際会議録
国際会議録
5. Quartz crystal microbalance(QCM)flight measurements of contamination on the MSX satellite
Wood,B.E. ; Hall,D.F. ; Lesho,J.C. ; Dyer,J.S. ; Uy,O.M. ; Bertrand,W.T.
出版情報: Optical System Contamination V, and Stray Light and System Optimization.  PartA  pp.187-194,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2864