1.

国際会議録
国際会議録
1. Performance of multiresolution pattern classifiers in medical image encoding from wavelet coefficient distributions
Mitra,S. ; Wilson,M. ; Kompella,S.
出版情報: Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California.  Part 1  pp.256-263,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3338
2.

国際会議録
国際会議録
2. Contact potential difference methods for full wafer characterization of Si/Si02 interface defects induced by plasma processing (Invited Paper)
Edelman,P. ; Savchouk,A. ; Wilson,M. ; Jastrzebski,L. ; Lagowski,J.J. ; Nauka,K. ; Ma,S. ; Hoff,A.M. ; DeBusk,D.K.
出版情報: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II :23-24 September 1998 Santa Clara, California.  pp.126-136,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3509
3.

テクニカルペーパー
テクニカルペーパー
3. A Hierarchical Approach to Optimal Aerodynamic Design
Sevant,N. ; Bloor,M. ; Wilson,M.
出版情報: 7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri.  pt. 2  pp.1099-1107,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
シリーズ名: AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
シリーズ巻号: CP9811