1.

国際会議録
国際会議録
1. Measurement of warpage of electronic packaging after machining by phase-shifting shadow moire method
Wang,W.-C. ; Liu,Y.-W.
出版情報: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.20-24,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4537
2.

国際会議録
国際会議録
2. Investigation on residual stresses induced by self-drilling screw on polycarbonate plates
Wang,W.-C. ; Shih,H.-J.
出版情報: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.66-71,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4317
3.

国際会議録
国際会議録
3. Field emission characteristics of carbon nanotube emitters using screen-printing technique
Lee,C.-C. ; Chuang,F.-Y. ; Lin,J.-D. ; Liao,J.-H. ; Cheng,H.-C. ; Sheu,J.-R. ; Chang,Y.-Y. ; Tsou,C.-C. ; Wang,W.-C.
出版情報: Display technologies III : 26-27 July 2000, Taipei, Taiwan.  pp.101-109,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4079
4.

国際会議録
国際会議録
4. Field emission display using carbon nanotubes as emitters
Chuang,F.-Y. ; Lee,C.-C. ; Lin,J.-D. ; Liao,J.-H. ; Cheng,H.-C. ; Han,C.-X. ; Kwo,J.-L ; Wang,W.-C.
出版情報: Display technologies III : 26-27 July 2000, Taipei, Taiwan.  pp.94-100,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4079
5.

国際会議録
国際会議録
5. Photoelastic investigation on thermal stresses in bonded structures
Hsu,J.-S. ; Wang,W.-C.
出版情報: Third International Conference on Experimental Mechanics : 15-17 October, 2001, Beijing China.  pp.170-173,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4537