1.

国際会議録
国際会議録
1. CHARACTERIZATION OF DEFECT STRUCTURES IN LELY 6H-SiC SINGLE CRYSTALS USING SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.313-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375
2.

国際会議録
国際会議録
2. COMPUTER AIDED SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHIC ANALYSIS OF MULTIPOLYTYPE SiC DEVICE CONFIGURATIONS
Huang, W. ; Wang, S. ; Dudley, M. ; Neudeck, P. ; Powell, J. A. ; Fazi, C.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.327-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375