1.

国際会議録
国際会議録
1. Characterization of Micropipes and Other Defect Structures in 6H-SiC Through Fluorescence Microscopy
Vetter, W. M. ; Dudley, M. ; Wong, T-F. ; Fredrich, J. T.
出版情報: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.561-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 406
2.

国際会議録
国際会議録
2. Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs
Huang, X. R. ; Dudley, M. ; Vetter, W. M. ; Huang, W. ; Wang, S. ; Carter, C. H., Jr.
出版情報: Applications of synchrotron radiation techniques to materials science IV : sympoisum held April 13-17, 1998, San Francisco, California, U.S.A..  pp.71-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 524
3.

国際会議録
国際会議録
3. X-ray Topography of a Single Superscrew Dislocation in 6H-SiC Through All {100} Faces
Vetter, W. M. ; Dudley, M.
出版情報: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.661-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 442