Strategy for Characterizing and Minimizing Effects of Tensile Stress in CSP's as Induced by Board Flexure

Strategy for Characterizing and Minimizing Effects of Tensile Stress in CSP's as Induced by Board Flexure

著者名:

掲載資料名:

Proceedings : 2000 International Symposium on Microelectronics, September 20-22, 2000, Hynes Convention Center, Boston, Massachusetts

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4339

発行年:

2000

開始ページ:

1

終了ページ:

8

総ページ数:

8

出版情報:

Reston, VA: IMAPS

ISSN:

0277786X

ISBN:

9780930815622 [0930815629]

言語:

英語

請求記号:

P63600/4339

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012055
シリーズID:	PA00000029
会議名:	International Symposium on Microelectronics
回次:	2000
会議開催地:	Boston, MA, USA
会議開催年:	2000.09.20-2000.09.22

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