1.

国際会議録
国際会議録
1. Monitoring of Mobile Sodium Ions in SiO2 Using Corona Charging
Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
出版情報: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.357-364,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-12
2.

国際会議録
国際会議録
2. Detection and Sources of Volatile Clean Room Contaminants
Muller, A.J. ; Psota-Kelty, L.A. ; Krautter, H.W. ; Sinclair, J.D. ; Stevie, F.A. ; Martin, E.P. ; Kahora, P.M. ; Nanda, A.K.
出版情報: Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II.  pp.143-156,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-3
3.

国際会議録
国際会議録
3. Nano-Scale Imaging of Compositional Defect and Dopant Distributions in Semiconductor Laser Heterostructures
Hull, R. ; Moore, M. ; Bahnck, D. ; Geva, M. ; Karlicek, R.F., Jr. ; Stevie, F.A. ; Walker, J.F.
出版情報: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.23-38,  1995.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 95-6