1.

国際会議録
国際会議録
1. Intrinsic point defect engineering in silicon high-voltage power device technology
Sobolev,N.A.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1801-1806,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
2.

国際会議録
国際会議録
2. On the Amorphization of the Si/Ge Superlattices upon Ion Bombardmerrt
Sobolev,N.A. ; Gartner,K. ; Kaiser,U. ; Konig,U. ; Presting,H. ; Wendler,B.Weber E. ; Wesch,W.
出版情報: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.289-292,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 248-249
3.

国際会議録
国際会議録
3. Structural defects and photoluminescence in dislocation-rich erbium-doped silicon
Vdovin,V.I. ; Sobolev,N.A. ; Emel'yov,E.M. ; Shek,E.I. ; Yugova,T.G.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1521-1526,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
4.

国際会議録
国際会議録
4. Donor centers in Er-implanted silicon
Emtsev,V.V. ; Andree,B.A. ; Poloskin,D.S. ; Sobolev,N.A. ; Shek,E.I.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1515-1520,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
5.

国際会議録
国際会議録
5. Capacitance spectroscopy of deep centres in SiC
Lebedev,A.A. ; Sobolev,N.A.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.715-720,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
6.

国際会議録
国際会議録
6. Influence of fabrication conditions on properties of Si:Er light-emitting structures
Sobolev,N.A. ; Emel'yanov,A.M. ; Nikolaev,Yu.A. ; Shtel'makh,K.F. ; Kudryavstev,Yu.A. ; Sakharov,V.I. ; Serenkov,I.T. ; Makovijchuk,M.I. ; Parshin,E.O.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1527-1532,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
7.

国際会議録
国際会議録
7. Optical and Electrical Properties of Si:Er Light-Emitting Structures
Sobolev,N.A. ; Alexandrov,O.V. ; Bresler,M.S. ; Gusev,O.B. ; Shek,E.I. ; Makoviichuk,M.I. ; Parshin,E.O.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.597-602,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
8.

国際会議録
国際会議録
8. Electrically Active Centers in Silicon Doped with Erbium
Emtsev,V.V. ; Alexandrov,O.V. ; Poloskin,D.S. ; Shek,E.I. ; Sobolev,N.A.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.615-620,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
9.

国際会議録
国際会議録
9. Yb luminescence centres in MBE-grown and ion-implanted GaAs
Gippius,A.A. ; Konnov,V.M. ; Loyko,N.N. ; Ushakov,V.V. ; Larikova,T.V. ; Kazakov,I.P. ; Dravin,V.A. ; Sobolev,N.A.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.917-922,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
10.

国際会議録
国際会議録
10. Fast Neutron Transmutation Reactions in Si-A New Way of Introduction of Mg-Related Centers
Sobolev,N.A. ; Emtsev,V.V. ; Gresserov,B.N. ; Klinger,P.M. ; Poloskin,D.S. ; Shabalin,E.P. ; Shek,E.I. ; Vyzhigin,Yu.V.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.129-134,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147