1.

国際会議録
国際会議録
1. Scanning-Tunneling-Microscopy Observation of Surface Reconstruction of GaN on Sapphire and 6H-SiC
Smith, A. R. ; Ramachandran, V. ; Feenstra, R. M. ; Greve, D. W. ; Neugebauer, J. ; Northrup, J. E. ; Shin, M. ; Skowronski, M.
出版情報: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.363-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 482
2.

国際会議録
国際会議録
2. The Structural Evolution of Lely Seeds During the Initial Stages of SiC Sublimation Growth
Heydemann, V. D. ; Sanchez, E. K. ; Rohrer, G. S. ; Skowronski, M.
出版情報: Power semiconductor materials and devices : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A..  pp.295-,  1998.  Warrendale, Penn..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 483