1.

国際会議録
国際会議録
1. Extrinsic Base Design of SiC Bipolar Transistors
Danielsson, E. ; Domeij, M. ; Zetterling, C.M. ; Oestling, M. ; Schoner, A.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1117-1120,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460
2.

国際会議録
国際会議録
2. Midgap Defects in 4H-, 6H- and 3C-SiC Detected by Deep Level Optical Spectroscopy
Reshanov, S.A. ; Schneider, K. ; Helbig, R. ; Pensl, G. ; Nagasawa, H. ; Schoner, A.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.513-516,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460
3.

国際会議録
国際会議録
3. Negative-U-Centers in 4H- and 6H-SiC Detected by Spectral Light Excitation
Weidner, M. ; Pensl, G. ; Nagasawa, H. ; Schoner, A. ; Ohshima, T.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.485-488,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460