Blank Cover Image

Detection of land mines with hyperspectral data

著者名:
Kenton,A.C. ( ERIM International,Inc. )
Schwartz,C.R.
Horvath,R.
Cederquist,J.N.
Nooden,L.S.
Twede,D.R.
Nunez,J.A.
Wright,J.A.
Salisbury,J.W.
Montavon,K.
さらに 5 件
掲載資料名:
Detection and remediation technologies for mines and minelike targets IV : 5-9 April, 1999, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3710
発行年:
1999
巻:
Part2
開始ページ:
917
終了ページ:
928
出版情報:
Bellingham, Washington: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431844 [0819431842]
言語:
英語
請求記号:
P63600/3710
資料種別:
国際会議録

類似資料:

Smith,A.M., Kenton,A.C., Horvath,R., Nooden,L.S., Michael,J., Wright,J.A., Mars,J.L., Crowley,J.K., Sviland,M.D., …

SPIE - The International Society for Optical Engineering

Schwartz,C.R., Eismann,M.T., Cederquist,J.N., Johnson,R.O.

SPIE-The International Society for Optical Engineering

Kenton,A.C., Malila,W.A., Nooden,L.S., Diehl,V.E., Montavon,K.

SPIE - The International Society for Optical Engineering

Cederquist,J.N., Schwartz,C.R.

SPIE-The International Society for Optical Engineering

Eismann,M.T., Schwartz,C.R., Cederquist,J.N., Hackwell,J.A., Huppi,R.J.

SPIE-The International Society for Optical Engineering

Q.A. Holmes, C.R. Schwartz, J.H. Seldin, J.A. Wright, L.J. Witter

Society of Photo-optical Instrumentation Engineers

Bartell,R.J., Schwartz,C.R., Eismann,M.T., Cederquist,J.N., Nunez,J.A., Sanders,L.C., Ratcliff,A.H., Lyons,B.W., …

SPIE - The International Society for Optical Engineering

Kenton, A.C., Geci, D.M., Ray, K.J., Thomas, C.M., Salisbury, J.W., Mars, J.C., Crowley, J.K., Witherspoon, N.H., …

SPIE - The International Society of Optical Engineering

C.R. Schwartz, A.C. Kenton, W.F. Pont, B.J. Thelen

Society of Photo-optical Instrumentation Engineers

Samson, J.W., Witter, L.J., Kenton, A.C., Holloway, J.H., Jr.

SPIE-The International Society for Optical Engineering

Schwartz,C.R., Cederquist,J.N., Eismann,M.T.

SPIE-The International Society for Optical Engineering

Cederquist, J.N., Schwartz, C.R., Cheng, K.C.

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12