1.

国際会議録
国際会議録
1. Effect of the traffic shaping function of the EF class in a DiffServ queue architecture
Kawabata, A. ; Sakaguchi, T. ; Yamamoto, S. ; Shimizu, S. ; Nishikido, J. ; Komura, H.
出版情報: Optical switching and optical interconnection II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October, 2002, Shanghai, China.  pp.118-125,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4907
2.

国際会議録
国際会議録
2. Material design for immersion lithography with high refractive index fluid (HIF)
Kim, M. ; Kim, H. ; Shim, K. ; Jeon, J. ; Gil, M. ; Song, Y. ; Enomoto, T. ; Sakaguchi, T. ; Nakajima, Y.
出版情報: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.10-19,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5753(1)
3.

国際会議録
国際会議録
3. Determination of Diffusivities of Si Self-Diffusion and Si Self-Interstitials using Isotopically Enriched Single- or Multi-30Si Epitaxial Layers
Matsumoto, S. ; Aid, S.R. ; Sakaguchi, T. ; Toyonaga, K. ; Nakabayashi, Y. ; Sakuraba, M. ; Shimamune, Y. ; Hashiba, Y. ; Murota, J. ; Wada, K. ; Abe, T.
出版情報: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.425-436,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 864
4.

国際会議録
国際会議録
4. Magnetic Properties of Fe-Pt Nanoparticle Protected by PVP Polymer
Ohmori, K. ; Umeda, T. ; Sakaguchi, T. ; Doi, M. ; Huayong, P. ; Asano, H. ; Tanaka, N. ; Matsui, M.
出版情報: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.2131-2134,  2005.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 475-479(3)
5.

国際会議録
国際会議録
5. The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquid [5856-129]
Sakaguchi, T. ; Ehara, K.
出版情報: Optical Measurement Systems for Industrial Inspection IV.  pp.994-1002,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5856
6.

国際会議録
国際会議録
6. Multi-layer resist system for 45-nm-node and beyond: Part II [6349-121]
Fujimura, Y. ; Morimoto, J. ; Manoshiro, A. ; Shimizu, M. ; Takamizawa, H. ; Hashimoto, M. ; Shiratori, H. ; Horii, K. ; Yokoya, Y. ; Ohkubo, Y. ; Enomoto, T. ; Sakaguchi, T. ; Nagai, M.
出版情報: Photomask Technology 2006.  pp.634936-634936,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6349
7.

国際会議録
国際会議録
7. Design and development of next-generation bottom anti-reflective coatings for 45.nm process with hyper NA lithography [6153-96]
Nakajima, M. ; Sakaguchi, T. ; Hashimoto, K. ; Sakamoto, R. ; Klshioko, T. ; Takei, S. ; Enomoto, T. ; Nakajima, Y.
出版情報: Advances in Resist Technology and Processing XXIII.  pp.61532L-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6153
8.

国際会議録
国際会議録
8. Noise-assisted propagation of signals through the chain of level-crossing detectors (Invited Paper)
Fuchikami, N. ; Sakaguchi, T.
出版情報: Noise in Complex Systems and Stochastic Dynamics.  pp.228-238,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5114
9.

国際会議録
国際会議録
9. Study on distinction of particles and bubbles for particle counting in liquids by the use fluorescence
Sakaguchi, T. ; Ehara, K.
出版情報: Optical Measurement Systems for Industrial Inspection III.  pp.855-863,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5144