1.

国際会議録
国際会議録
1. Flash memory-cell characterization using two-transistor cell compact macro-model for system-on-chip design
Chen, C. ; Saha, S.
出版情報: Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA.  pp.79-86,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5755
2.

国際会議録
国際会議録
2. An electrostatic analysis of subthreshold behavior in FINFET
Murugan, B. ; Venkat, R. ; Saha, S.
出版情報: Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA.  pp.157-165,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5755