Blank Cover Image

CHARACTERIZATION OF QUANTUM WELLS BY AUGER ANALYSIS ON CHEMICAL BEVELS

著者名:
掲載資料名:
Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
91
発行年:
1987
開始ページ:
497
終了ページ:
502
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837586 [0931837588]
言語:
英語
請求記号:
M23500/91
資料種別:
国際会議録

類似資料:

Jelen,C., Slivken,S., Brown,G.J., Razeghi,M.

SPIE-The International Society for Optical Engineering

Erdtmann,M., Matlis,A.W., Jelen,C.L., Razeghi,M., Brown,C.J.

SPIE - The International Society for Optical Engineering

Geatches, Rachel M., Reeson, Karen J., Criddle, Alan J., Webb, Roger P.

MRS - Materials Research Society

Hoff, J., Kim, S., Erdtmann, M., Williams, R., Piotrowski, J., Bigan, E., Razeghi, M., Brown, G.J.

Electrochemical Society

Jelen, C., Slivken, S., Brown, G. J., Razeghi, M.

MRS - Materials Research Society

Erdtmann,M., Razeghi,M.

SPIE-The International Society for Optical Engineering

Jelen,C., Slivken,S., Brown,G.J., Razeghi,M.

SPIE - The International Society for Optical Engineering

Godlewski,M., Surma,M., Zakrewski,A.J., Wojtowicz,T., Karczewski,G., Kossut,J., Bergman,J.P., Monemar,B.

Trans Tech Publications

Razeghi,M., Jiang,J., Jelen,C.L., Brown,G.J.

SPIE-The International Society for Optical Engineering

J. Hoff, E. Bigan, G.J. Brown, M. Razeghi

Society of Photo-optical Instrumentation Engineers

Hoff,J.R., Jelen,C., Slivken,S., Brown,G.J., Razeghi,M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12