Diagnosing abnormal operating conditions of rotational machineries and machine tools with physical wavelets

Diagnosing abnormal operating conditions of rotational machineries and machine tools with physical wavelets

著者名:

掲載資料名:

Process Control and Inspection for Industry

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4222

発行年:

2000

開始ページ:

417

終了ページ:

426

総ページ数:

10

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437945 [0819437948]

言語:

英語

請求記号:

P63600/4222

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00011941
シリーズID:	PA00000029
会議名:	Optics and Optoelectronic Inspection and Control : Process Control and Inspection for Industry
回次:	2000
会議開催地:	Beijing, China
会議開催年:	2001.11.08-2000.11.10

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