1.

国際会議録
国際会議録
1. Study of Pore Architecture in Silicon Oxide Thin Films by Variable-Energy Positron Annihilation Spectroscopy
Ito, Kenji ; Kobayashi, Yoshinori ; Yu, Runsheng ; Hirata, Kouichi ; Togashi, Hisashi ; Suzuki, Ryoichi ; Ohdaira, Toshiyuki ; Egami, M. ; Arao, H. ; Sakurai, C. ; Nakashima, A. ; Komatsu, M.
出版情報: Structure-property relationships of Oxide surfaces and interfaces II : symposium held December 2-3, 2002, Boston, Massachusetts, U.S.A..  pp.97-102,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 751
2.

国際会議録
国際会議録
2. Point Defects in Thin HfAlOx Films Probed by Monoenergetic Positron Beams
Uedono, Akira ; Mitsuhashi, Riichiro ; Horiuchi, Atsushi ; Torii, Kazuyoshi ; Yamabe, Kikuo ; Yamada, Keisaku ; Suzuki, Ryouichi ; Ohdaira, Toshiyuki ; Mikado, Tomohisa
出版情報: Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.43-48,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 786
3.

国際会議録
国際会議録
3. Characterization of Porous Silicate Low-k Films by Ellipsometric Porosimetry and Variable-Energy Positron Annihilation Spectroscopy
Ito, Kenji ; Kobayashi, Yoshinori ; Suzuki, Ryoichi ; Ohdaira, Toshiyuki ; Yu, Runsheng ; Sato, Kiminori ; Hirata, Kouichi ; Togashi, Hisashi ; Egami, Miki ; Arao, Hiroki ; Nakashima, Akira ; Komatsu, Michio
出版情報: Continuous nanophase and nanostructured materials : symposium held December 1-5, 2003, Boston, Masachusetts, U.S.A..  pp.397-402,  2004.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 788